VS
4.0评论日期：May 15, 2026
lecture are a bit short and readings are very long
Quick introduction and review of important topics. I wish if more such courses are introduced.
Optical and X-Ray Characterization
Optical and X-ray techniques are powerful ways to characterize semiconductor thin films. They can be used to measure film thickness, purity and crystalline quality, and for compositional analysis. Modern techniques are fast, turn-key, and generally non-destructive, allowing for rapid assessment of material properties. This course describes the fundamentals of optical and X-ray characterization and provides real-world examples of how they are used in semiconductor manufacturing.
状态：Structural Analysis
状态：Analytical Chemistry
中级课程小时
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KN
5.0评论日期：May 8, 2024
Quick introduction and review of important topics. I wish if more such courses are introduced.
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Kuna Lakshun Naidu
5.0
评论日期：May 9, 2024Roy David Moya Serrano
5.0
评论日期：Jan 11, 2025Excellent course; I have learned a lot, thanks
Carter Hung
5.0
评论日期：May 14, 2024Very practical and useful, thanks!
Mike Bowyer
5.0
评论日期：Apr 7, 2025Enjoyed the courses very much!
Zahid Ullah
5.0
评论日期：Dec 18, 2023best course
Vishwen Shah
4.0
评论日期：May 16, 2026lecture are a bit short and readings are very long
Haroon Khan
4.0
评论日期：Jul 26, 2025v.good
Ian Binnie
2.0
评论日期：Jun 9, 2024I do semiconductor and materials characterization for a living. so this course was too basic in my opinion, its an ok introduction to some of the instruments. Would be nice if there was more exercises like the one used for the solar cell roughness project.